Bits & Chips Benelux RF Conference 29. May 2024 Nijmegen

Lecture Sajjad Ahmed | Focus Microwaves: Sub-THz load pull and characterization of noise parameters

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CAM - Workshop: Innovation in Failure Analysis and Material Diagnostics of Electronics Components 2019

CAM-Workshop: »Innovation in Failure Analysis and Material Diagnostics of Electronics Components«

Location: Leibniz-Institute of Agricultural Development (IAMO), Halle (Saale)
Date: 10.-11. April 2019

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