New: Non-contact Probe Station TeraProbes for on-wafer device and IC characterization
Paying too much for fragile contact probes? Want to test your wafers without touching them?
The solution is TeraProbes Non-contact probe station for on-wafer device and IC characterization. The probe station is delivered pre-configured for optimal performance.
Introducing Non-contact Probe Station
Setting up TerProbes Non-contact Probe Station
Calibration of Non-contact Probe Station
