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Component characterisation using RF measurement technology
Electrical measurement solutions for the efficient characterisation of semiconductors and components
With our measurement systems for component testing, you analyse semiconductor components, materials and RF components precisely, efficiently and reproducibly. During semiconductor testing, electronic components such as transistors, diodes or microchips are tested for functionality, reliability and compliance with specifications.
What methods can be used to characterise semiconductors and other components electrically?
Our portfolio includes solutions for load pull, noise parameter testing, DC parameter testing, IV characterisation and S-parameter measurements.
In this way, we support companies in the fields of development, production and research in the reliable evaluation and optimisation of electronic components and semiconductors.
DC Parameter Testing
S-Parameters
Various approaches to component characterisation
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Load pull & noise parameter measurement: High-performance tuner solutions for precise noise measurements in RF and microwave ranges.
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DC parameter testing with state-of-the-art SMU systems: Flexible measurement solutions for current, voltage and material characterisation in laboratory and testing systems.
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IV and pulsed IV characterisation: Informative curve measurements for semiconductor analysis, modelling and technology development.
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Precise S-parameter measurement: Coaxial vector network analysers and waveguide extension modules for millimetre-wave frequencies, as well as complete RF testing stations for reliable measurement results
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Radio frequency and millimetre-wave power measurement: up to 3THz
We are experts in component characterisation: Put us to the test.
Our aim is to answer your questions comprehensively and competently.
With a broad portfolio of components and the cross-disciplinary expertise of our colleagues across our group of companies, we are your strong partner.