DC Parameter Testing

The modern way to carry out electrical characterisation of power semiconductors quickly and easily.

The sensible and economical use of energy is more important today than ever before. Modern power semiconductors make a valuable contribution, helping to make electrical systems even more efficient and economical. Semiconductor manufacturers require precise data on the exact electrical properties of their components as a basis for further optimisation.

Thanks to its modular design, the Keysight B1505A offers flexible customisation options, enabling the instrument to be used for testing virtually all technologies.
The possibilities range from testing packaged components to on-wafer testing. bsw’s expertise complements the offering with services ranging from training and consultancy to turnkey solutions.

The fastest and most accurate way for circuit designers to obtain reliable component parameters.

Developers of power electronics are striving for circuit designs that are ever more efficient and, at the same time, more cost-effective. This raises a number of challenges. Efficiency can be improved, amongst other things, by using more precise component parameters during circuit development and simulation. However, when dealing with critical parameters, one should not rely solely on data sheets due to component variation; instead, the data must be determined in-house for the components used within the organisation. Due to increasing price pressure, more comprehensive incoming goods inspection is becoming ever more important.

The Keysight B1506A provides users in the relevant departments with a tool that is both easy to use and highly precise. Here too, bsw offers efficient services relating to the measuring instrument to make it as easy as possible for users to get started and carry out their day-to-day work.

High-precision, modular SMU units for use in automated testing.

Many tasks in the field of semiconductor characterisation and in testing electronic assemblies are routine tasks. Test series of new components or even random production samples are routinely measured in large numbers for a wide variety of electrical parameters. This does not require a measuring instrument with a complex graphical user interface. A simple interface for remote control via a PC is sufficient. Evaluation and visualisation of the results are also carried out on PC. With the Keysight E5270B and its ‘little brother’, the E5260A, two powerful, modular SMUs are available for integration into automated testing systems. bsw will be pleased to advise you on integration issues and, on request, can put together bespoke end-to-end solutions, including the relevant software.

Switching matrices simplify measurements on complex semiconductor testing structures.

In semiconductor development and scientific research, complex testing structures with numerous connections are often used. Special switching matrices are used to connect these testing structures flexibly to the usually limited resources of measuring equipment. The use of standard general-purpose scanners or multiplexers is not recommended for this purpose, as they are not sufficiently shielded and, due to their internal leakage currents, can mask the lower signal levels, e.g. in the reverse-biased state of a semiconductor. Special ‘guarded’ measurement paths in the Keysight semiconductor testing matrices ensure that even very small signals are not lost. Such matrices can be used both as system components in an automated testing system and in conjunction with a Keysight B1500A parameter analyser. bsw provides expert advice on the use of a switching matrix for your measurement application and will find the right solution for you.

Semiconductor components (e.g. IGBTs) for high-power applications are often very bulky. If cooling elements are also fitted, the dimensions exceed the available space in any conventional test adapter.

To solve this problem whilst enabling comfortable yet safe working, we have developed a special hood with an extended work surface.

• For the characterisation of power semiconductors, this hood is specifically tailored to the Keysight power device analysers B1505A and B1506A.
• The respective test fixture is seamlessly integrated into the hood whilst retaining its original condition. As a result, it also retains the full manufacturer’s warranty.
• Proprietary safety technology with a locking mechanism and the integration of the measuring instrument interlock ensure safe operation.
• The force required to move the hood visor is reduced to a minimum by specially calibrated gas springs – ergonomics meets safety.

The internal chamber volume of approx. 500mm x 700mm x 600mm (D x W x H) is, in most cases, sufficient even for unusual DUTs. Versions are available with adaptations for tests up to 3kV and for 10kV.

The most popular variant comes with a base frame on castors, into which the measuring instruments can also be integrated. This solution is not only safe and flexible, but can also be moved around within a laboratory. Fixed versions without a mobile base frame, designed to be placed on a laboratory bench, are also available.

Are you looking for a bespoke solution for semiconductor testing? Give us a call or get in touch via email.

Triax is the de facto standard for test leads and connectors in semiconductor measurement technology.

The three-layer design of the test leads largely prevents leakage currents along the measurement path, thus ensuring the best possible measurement results. In reality, however, compromises are often unavoidable. This is where adapters come in – much to the chagrin of many users, they are available in an almost overwhelming variety.

We provide information on the options available, as well as the advantages and disadvantages of other common adapters, in the Adapters section.

The ultra-high voltage bias tee is an accessory used for CV measurements on semiconductor components in conjunction with the Keysight B1505A. It supports measurements of the device capacitances Cds and Cgd for ‘normally off’ components. The UHV bias tee combines the test signals from the B1505A’s MFCMU and the N1268A ultra high voltage expander. The outputs of the UHV bias tee are connected to the designated UHV inputs of the N1265A testing fixture. Alternatively, the outputs of the ultra high voltage bias tee can also be connected to a custom testing fixture or a wafer prober.

Further information on bias tees can be found in our components overview.