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eFuse / Probe Protectors

Doing on-wafer measurements of power semiconductors with expensive samples, slipping of the sample or unreliable contacting can quickly lead to high DC current and destroy both the test object and the sample [1]. But there is a very compact and easy-to-use device that can save a lot of money: the eFuse. The circuit is passed through this device and is interrupted in a very short time when an adjustable maximum current limit is exceeded. The very short time for switching off is in the range of 300-500 ns. An RS232 interface allows for remote control.

Product Number

Max. Voltage

VDC

Max. Voltage

ADC

Typical switch-off

time

Size

(WxDxH))

eFuse 2-100-10

100V

10A

<300ns

23cm-20cm-8cm

eFuse 2-200-10

200V

10A

<300ns

23cm-20cm-8cm

eFuse 2-300-10

300V

10A

<300ns

23cm-20cm-8cm

eFuse 3-080-30

80V

30A

<500ns

29cm-26cm-8cm

 

If you need voltage or current values that are not yet achieved with our eFuse models, please contact us. We’d like to work on the further development of the eFuse with you.

 

[1] M. I. Khalil, A. Liero, A. von Müller und T. Hoffmann, “Current Switch-Off Solution to Protect RF Power Transistors during Measurements”, Microwave Journal, Vol. 50, Issue 7, Seiten 102-106, 2007.