ESD Characterisation according to HBM, MM, TLP, VF-TLP, HMM und CDM Standards
Manual or automatic precision characterization of ESD Effects on integrated circuits according to international standards
The term ESD stands for “electrostatic discharge” and means the electrical discharge between two points of high potential difference. What can be observed in the sky as lightning can be generated in a much smaller scale in a lab with a number of different instruments.
Basic testing electric circuits for their immunity against accidental electrostatic discharges (e.g. caused by certain carpets) can be done with very simple tools.
The following testsystems are used mainly in the semiconductor industryto accurately characterize the integrated safety components against electrostatic discharges. In the industry different methods are used to characterize these effects:
HBM: Human Body Model – one of thetwo „required“ methods.
CDM: Charged Device Model – the other „required“ method.
MM: Machine Model. Phased out HBM: Human Body Model - eine der beiden "erforderlichen" Methoden.
CDM: Charged Device Model - die andere "erforderliche" Methode.
MM: Machine Model. Nicht mehr so oft angewendet.
TLP: Transmission Line Testing
VF-TLP: Very Fast TLP
HMM: Human Metal Model.
TLP: Transmission Line Testing
VF-TLP: Very Fast TLP
HMM: Human Metal Model
Our partner Grund Technical Solutions is a well known provider of innovations for the above mentioned tests. Flexible hardware is complemented with feature-rich software. In cooperation with the well-known prober supplier Signatone we are able to supply an advanced solution to test modules or wafers ranging from economic manual to semiautomatic stations for high speed testing.
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Pure Pulse |
Scorpion |
Titan |
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HBM |
✓ 4kV, 8kV option |
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✓ 16kV |
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TLP |
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- |
- |
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VF-TLP |
✓ 750V 1-10ns Pulse Width 100ps Rise Time Cannot be combined with other pulsers |
- |
- |
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HMM |
✓ 16kV |
- |
- |
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MM |
✓ 400V |
- |
- |
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CDM |
- |
✓ 1kV (2kV uncalibrated) |
- |
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Test at wafer level |
✓ |
- |
- |
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Automated testing |
✓ Flying Probes Semi-Automatic Probe Station |
✓ Semi-Automatic Probe
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- |
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Bias |
✓ Up to 10 |
- |
- |
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DC Leakage |
✓ |
- |
- |
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Capture waveforms |
✓ |
✓ |
- |
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All test models without hardware changes |
✓ |
✓ |
✓ |
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Upgrades |
✓ Pulsers Bias |
- |
- |
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Test packages |
✓ |
✓ |
✓ |
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Package max pin count |
Unlimited (100mm x 100mm) |
Unlimited (150mm x 150mm) |
48 128 option |
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Form factor |
Tabletop + Probe Station |
Floor Standing |
Tabletop |
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Dimensions |
W x L x H 17.5" x 14.5" x 12.5-24" 44cm x 37cm x 32-61cm |
W x L x H 23" x 26" x 48" 59cm x 66cm x 122cm
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W x L x H 19.5" x 14.5" x 9" 49.5cm x 37cm x 23cm
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Dimensions of probe station |
W x L x H 27" x 30" x 22" 69cm x 76cm x 56cm |
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