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Wafer probing with DC and radio frequency contact solutions
Stable contact in the DC, RF and millimetre-wave frequency ranges
In wafer probing, it is essential to transmit measurement signals between the instruments and the chips on the wafer with as little loss as possible, free from reflections and in a reproducible manner. Only stable contact enables accurate and repeatable tests. Radio frequency contact solutions ensure precise measurement results when characterising modern semiconductors.
Our probe stations and radio frequency test solutions have been specially developed to meet the requirements of RF probing. They combine high accuracy with reliable stability and can be flexibly adapted to different wafers, frequency ranges and measurement tasks. This saves time during test preparation for on-wafer measurements and enables you to achieve reproducible results in research, development and production.
Wafer probers
Wafer probes
Micromanipulators
Shop – RF accessories
Wafer probing test systems and components
Drawing on our experience in radio frequency probing, we offer wafer test solutions that integrate seamlessly into existing measurement environments. Users benefit from ease of use, robust technology and consistently high measurement quality. In this way, our wafer probing systems lay the foundation for the reliable validation and further development of modern semiconductor technologies.
How do you configure test systems for precise RF wafer probing?
In RF wafer probing, it is not only the network analyser and the test probes that determine the quality of the results. Probe station, RF probes, cables, calibration standards, positioners and software must be precisely matched to the frequency range, pad geometry and measurement task.
Special requirements arise for millimetre-wave and terahertz measurements, load-pull tests, noise parameter analyses and combined DC and RF measurements. Parasitic effects, crosstalk, cable movement and thermal drift can influence the measured values even with the slightest deviations.
To this end, we configure specialised wafer probing systems comprising carefully matched components. These include manual, motorised and semi-automatic probe stations, RF probes, micro manipulators, impedance tuners, calibration solutions and the appropriate measurement technology. Custom set-ups, system extensions, commissioning and user training are also tailored to the specific measurement task.
We are experts in radio frequency technology: Put us to the test.
Our aim is to answer all your questions regarding wafer probing.
Our extensive product portfolio and our team’s cross-disciplinary expertise make us ideally placed to do so.