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What are wafer probes used for?
Wafer probes are used to reliably capture signals and measurement values on very small contact areas – for example, on transistors, diodes, integrated circuits, sensors or passive structures.
In RF measurement technology, e.g. in wafer probing, RF microprobes transmit the measurement signal from the coaxial cable or measuring instrument to the contact pads of the device under test. They are used, amongst other things, in S-parameter measurements, power, noise and millimetre-wave measurements. Key factors are reproducible contact, low signal loss, stable impedance conditions and minimal interference with the DUT.
The extremely fine test probes are used primarily in electronics, semiconductor technology and quality assurance.
Accessories for high-frequency applications in on-wafer testing
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Accessories for high-frequency applications in on-wafer testing
For precise measurement results in on-wafer testing, it is not only the wafer probe itself that is crucial. The entire mechanical and electrical test setup must be suited to the application. We offer a wide range of accessories from various international manufacturers for this purpose.
What are the typical RF accessories?
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Wafer probes and probe needles for DC, RF and specialised measurements
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Probe holders and needle holders for the secure mounting of contact needles
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Micro positioners and manipulators for precise alignment and accurate contacting of the smallest structures
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Chucks and thermo chucks for secure holding of the wafer and for measurements at defined temperatures
As an experienced partner in radio frequency and semiconductor testing technology, we combine practical application knowledge with project experience and support you in the design of complete testing solutions. We also supply wafer probes and other components from various manufacturers, such as Picoprobe, for a wide range of measurement tasks and applications.
Wafer probes, probe tips and probe holders
The fine probe tips establish electrical contact with the DUT and are therefore a critical link in the measurement chain. Standard probe tips are suitable for routine measurements. Specialised probe tips are used when very small currents and voltages, high currents and voltages, or specific parameters such as capacitance need to be measured.
Probe holders mechanically connect the probe needle to the micro positioner. They secure the electrical contact with the DUT, route the cable to the measuring instrument and bridge the distance between the micro positioner and the contact pad on the wafer. Specialised solutions are available for demanding applications, such as contacting with coaxial or triaxial test leads for highly sensitive DC measurements in shielded chambers.
Probe cards are primarily used in automated wafer sorting and production testing when numerous contact points or multiple dies need to be contacted simultaneously.
Chucks and Thermochucks
Chucks are used to securely hold and position the wafer. Thermo chucks extend the measurement setup to include defined temperature conditions. This allows components to be characterised at different temperatures – from cryogenic to high-temperature measurements. This allows real-world operating conditions to be better replicated in the laboratory.
We are experts in radio frequency technology: Talk to us.
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