Wafer Probe Systeme / Probing Stations, Equipments & mehr

With SIGNATONE based in California we have an experienced and powerful partner for Probe Stations and contacting solutions (www.signatone.com). This means that we always have the right wafer probing machine to hand, regardless of whether you are looking for a manual, Semi-Automatic or fully automatic probing solution.

With our own supplements and components, which we develop in-house in Sindelfingen, Germany, we are able to design complete solutions according to your specifications and configure wafer probe machines tailored and optimised for your applications and tests. For this purpose we also supply the necessary equipment, such as coaxial or triaxial chucks up to 300 mm diameter, RF probes, measuring cables, coaxial and triaxial DC probes for lowest leakage currents or for very high voltages and currents. We can provide you with comprehensive advice on the integration of mmWave modules and tuner systems into your probe station to carry out optimum tests. In the field of parameter analysis, experience ranges from measurements in the fA range to systems for 20kV and 1500A pulse current.

In addition to consulting and sales, we also offer commissioning and training for wafer probe stations. If required, we can train your employees to enable you to handle your new prober system. This means you can get started with wafer testing straight away. If your tasks change over the years, we can support you with upgrades and conversions of your machines. This service includes the conversion of a manual prober to a Semi-Automatic machine or the integration of modules, tuners, motorized manipulators, microscopes and other equipment.

In addition to consulting and sales, we offer commissioning and training for Probe Stations. If required, we can train your employees to enable them to quickly start using your system for the tasks at hand. If your tasks change over the years, we will support you with upgrades and conversions, such as the conversion of a manual sampler to a semi-automatic machine or the integration of modules, tuners, motorised manipulators and microscopes.

On our website you will find product information about the following probe systems:

• Manual Probe Stations (series: 1160, Wavelink, CheckMate, MAPS)
• Motorised Probe Stations (series: Wavelink and CheckMate)
• Semi-automatic Probe Stations (series: Wavelink and CheckMate)

Wafer Prober

A wafer prober is a device used in industry and academic research to make electrical contacts to circuits and structures on semiconductor wafers or other substrates.

These machines are available with different equipment. In general, the following features can be distinguished in probe testing:

• Degree of automation (manual, semi-automatic or fully automatic operation for chip testers)
• Special equipment for HF measurements or for measuring very low or very high voltages and currents
• Universal accessories for adaptation to specific measurement tasks

The structured planning and execution of each test step on the wafer ensures that your probe testing is precisely tailored to your test requirements.

We advise you on the optimum sample solution

Do you have further questions about wafer probing?
Do you have tests that you cannot carry out with standard devices?
Are you struggling to choose the right probe system?

Pure theory does not help. The selection and precise configuration of a wafer prober is best clarified in an individual consultation. In many cases, we can also support you with special applications, such as the transport of graphene layers. Whether it's an entry-level model or a highly specialized special solution - we have the best solution for you!

We are experts in exact sample tests: Ask us directly.

Contact me and receive professional advice.

I look forward to your inquiry!

Elmar Neumann

Tel:      +49(0)7032 895 93-40

E-Mail: elmar-neumann@bsw-ag.com